Analyzing EM/IR in IC design layouts to ensure reliability and performance
Solving electromigration and IR drop issues in IC design layouts is critical to ensure IC performance and reliability
Electrical reliability is fundamentally different from mechanical reliability. Because ICs don’t have moving parts, their reliability is mainly determined by external factors such as electrostatic discharge, electromigration, and variations in voltage and temperature. By understanding the root causes of critical issues like electromigration and IR drop, designers can apply this knowledge to fix and optimize IC layouts to reduce or eliminate their effects in the manufactured product. EDA tools that perform the requisite design analysis and provide accurate data in a timely manner can help design teams achieve their circuit performance and reliability goals while maintaining or accelerating time to market.