Pioneering semiconductor reliability automotive apps

The automotive industry is currently entering the third generation of semiconductor reliability, marked by a shift from standard compliance and application-specific advancements to a focus on chip and chiplet-specific reliability. In this context, Imec has introduced the Canary on-chip degradation monitor, a cutting-edge technology that integrates on-chip degradation monitoring circuitry with advanced data analytics based on a physics-based model. This innovative system is designed to accurately assess the age of an integrated circuit (IC) and detect any potential tampering through high-temperature annealing. Such capabilities are crucial for predictive and proactive maintenance during both in-field operations and dynamic wafer testing phases.

Canary's on-board degradation sensor solution is pivotal in enhancing vehicle safety through early detection of potential failures, supporting predictive maintenance to minimize downtime, and ensuring compliance with stringent automotive safety standards, including ISO 26262 and the new ISO/TR 9839:2023. This technology not only extends the lifespan of vehicles by managing IC health proactively but also reinforces trust and reputation by demonstrating a commitment to reliability and safety.

Employing a seamless integration into customer-specific chip designs, the technology monitors key degradation mechanisms such as Bias Temperature Instability (BTI) and Hot Carrier Degradation (HCD). Utilizing a robust physics-based model, it provides real-time assessments of the chip’s remaining lifespan and enhances security measures against tampering, making it a critical advancement in semiconductor technology for the automotive sector.