In-system deterministic test enables you to change test patterns as new defects and fault models emerge or as test content needs change. Launched at ITC NA 2024, Tessent In-System Test (IST) complements Tessent Streaming Scan Network (SSN) and enhances its ability to be used in an in-system, in-field environment, thus extending the advanced technology Tessent SSN provides. Designers can apply embedded deterministic test (EDT) patterns generated using Tessent Streaming-Scan Network (SSN) software through the SSN bus directly using the in-system test controller. This environment delivers the test pattern content at the same high rate of speed expected from manufacturing test.