Technical Paper

Provide robust latch-up protection with schematic netlist circuit verification

latch-up | SCR cross-section showing parasitic coupling between diffusions connected to VDD and VSS

With the spread of electronics into critical infrastructure such as transportation, power generation and delivery, aerospace and military, and medical devices, failure is not only undesirable, it is simply not an option. Implementing an efficient and accurate automated latch-up verification flow can help design companies deliver products that meet the high performance and reliability standards of today’s markets, while using the most efficient and cost-effective means possible.

Preventing latch-up with Calibre® PERC™ automated IC reliability verification

Latch-up is a critical failure condition that can down­grade performance or lead to total IC failure. Traditional latch-up detection occurs too late in the design flow, leading to costly and time-consuming physical layout changes. By running Calibre PERC verification on the schematic netlist during early design phases, designers can quickly identify latch-up sensitive scenarios through topological analysis. Latch-up scenarios can then be resolved through circuit design changes without any major impact on IC implementation, preventing expen­sive delays and emergency rerouting.

Calibre PERC verification can also be run during the post-layout stage to ensure the full chip is protected against performance degradation and product failure. With this multi-stage approach, the Calibre PERC reliability platform provides a comprehensive, efficient, automated, and reliable way for IC design teams to find and prevent latch-up failure scenarios before they require costly design changes that delay the tapeout schedule.

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