Calibre xACT

Achieve first-pass silicon success with confidence by accurately and efficiently modeling complex parasitic effects in your advanced nanometer designs.

The Calibre xACT parasitic extraction solution is a high-performance, high-accuracy tool designed to meet the challenges of advanced nanometer designs, including FinFET technology and multi-patterning. It offers attofarad accuracy for diverse IC design styles, from digital to custom analog and RF, and delivers fast, scalable performance through net-based parallelism and multi-CPU processing. Integrated with other Calibre tools and supporting foundry-qualified rule decks, Calibre xACT ensures accurate modeling of physical and electrical effects, enabling designers to confidently achieve performance and integration goals while optimizing for specific IC applications and accelerating time-to-market.