Ahmed Hassan, Product Management Director for Calibre parasitic extraction at Siemens EDA, provides an overview of the critical role and evolving challenges of parasitic extraction in advanced semiconductor design.
With semiconductor technology continually advancing, the significance of accurate parasitic extraction during both design and signoff stages has become paramount. The complexity of parasitic extraction is further compounded by specialized technologies across various process nodes, including MEMS, CMOS image sensors, RF, analog, and more. Addressing these challenges requires sophisticated techniques, such as in-context coupling, redistribution layer modeling, 2D resistance modeling, inductance extraction, and handling multiple design corners. Siemens EDA's Calibre parasitic extraction suite, particularly the Calibre xACT platform, offer a proven solution for signoff extraction across diverse nodes and applications.
Calibre xACT integrates a fast 3D deterministic field solver, advanced device modeling, and efficient extraction methods. It ensures attofarad-level accuracy for dynamic analog circuit simulation while accommodating multimillion-instance digital designs with ease. Calibre xACT excels in speed and scalability through its parallel architecture, delivering consistent and predictable results across multiple design corners with minimal runtime overhead. Leveraging foundry-qualified rule decks and compatibility with Calibre nmLVS, Calibre xACT offers a seamless integration experience for design teams. With intuitive GUI-driven interfaces and robust design integration capabilities, Calibre xACT streamlines the extraction process, enabling efficient back-annotation and cross-probing across popular layout environments.
Explore the Siemens website for more information about the Calibre parasitic extraction offerings.