Mission IR Possible - Full-chip IR drop analysis of an image sensor with mPower

Semiconductors like the image sensors created by ARRI present design challenges as engineers juggle timing constraints, performance optimization, power efficiency and clock speeds within tight budgets and deadlines. This often leads to limited attention for IR drop analysis, which can significantly impact image quality in a CINE-image sensor. To address this, the mPower power integrity analysis tool provides comprehensive power distribution analysis, ensuring consistent power delivery across the entire chip. In this video, ARRI and Siemens demonstrate the effectiveness of mPower on an image sensor chip and showcase its benefits at setup, block level and full-chip usage.