Embedded Analytics: A platform approach

Burgeoning complexity, both in systems-on-chip (SoCs) and in the embedded systems they enable, poses a challenge for the semiconductor industry. In this paper, we outline the multi-dimensional nature of this complexity and the costs and opportunities it generates. We demonstrate that the key to rising to this challenge is the ability to attain system-level visibility: both during the semiconductor development cycle, and subsequently after embedded systems are deployed in the field.

As a solution, we present a platform approach – Tessent™ Embedded Analytics – that integrates smart on-chip monitoring, communications hardware and software, APIs and application software. The platform provides a solution for a problem space that has grown in scope from SoC debug to the optimization of product performance, throughout the lifecycle from conception all the way through to end-of-life.