Using high-quality deterministic test patterns for in-system/in-field testing with Tessent In-System Test

Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve high-quality testing due to the increased complexity of designs. The growing amount of electronic content, along with the shift toward fully autonomous vehicles, demands stringent testing requirements.

In-system deterministic test (IS-EDT) methods are necessary to address aggressive test-time constraints, design complexity and the need to update test content based on defect rates. These methods combine the generation and retargeting of deterministic test patterns. Tessent In-System Test, a solution from Siemens EDA, integrates IS-EDT with the Tessent Streaming Scan Network (SSN) to enable users to run deterministic patterns in-system. While the demand for IS-EDT patterns is especially critical in the automotive industry, this technology also benefits data center and networking designs.

This paper outlines how Tessent In-System Test meets the needs for in-system and in-field testing.