QuickTopic: Timing-Aware ATPG - Small Delay Defect Detection

There is a growing trend to test semiconductor devices for small delay defects. Traditional transition at-speed scan testing does not target small delay defects. Timing-aware ATPG can automatically find the longest paths for all target fault sites on the fly. This video describes timing-aware ATPG and significant unique detection silicon results when combining timing-aware ATPG with small delay cell-aware test.