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Complementing functional verification through use of available timing information

Image of stacked silicon wafers with microchip patterns in blue and purple hues.

Since the advent of formal techniques, the applications of formal analysis have helped designers to achieve more in-depth analysis and coverage of their verification activities. However, what helped the growth and popularity of such techniques has been specific and targeted applications of formal analysis.

In this paper, we will examine several examples where the functional verification tasks can benefit from timing information often readily available in the design.

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