Today, in the automotive market, LBIST (Logic Built-In Self-Test) is the best solution to guarantee thorough coverage of the digital components within an acceptable timeframe. However, to reduce this time, Test Points are required, which affect the area and power performance. Observable Scan Technology (OST) is a feature that enables faster achievement of the targeted coverage with a different impact on the area. This presentation will demonstrate the coverage differences between Test Points and OST, as well as the impact on the area for three different chips that we have in the division.