The Calibre Defect Management solutions address the problem of underutilization of SEM and eBIM images in yield analysis. Offering full-flow design-guided platforms and vendor neutral solutions, Calibre Defect Management enables accurate wafer defect characterization, classification and root-cause analysis. Its user-friendly interface facilitates efficient wafer defect monitoring and collaboration within fabs. Integrated with machine learning capabilities like Calibre SONR, Calibre Defect Management ensures smart down-selection of regions and improves defect hit rates within budget constraints.