Artificial intelligence (AI) and machine learning (ML) are seeing growing adoption in a wide range of applications. The integrated circuits (ICs) used in AI/ML applications are characterized by large parallel processing computation units, high power dissipation, and complex circuitry that can deliver maximum performance within a strict power budget. Ensuring the reliable design and verification of these complex ICs is critical, since circuit failures in these chips can have major consequences, especially for ICs used in mission-critical applications.
The processor chips used in AI/ML applications are characterized by large parallel processing computation units, high power dissipation, and complex circuitry that can deliver maximum performance within a strict power budget. Accurate assessment of IC reliability issues such as electromigration, power and clock gating, dynamic voltage and frequency scaling, and electrical overstress are crucial to delivering the intended power efficiency while maintaining compliance with all design constraints.