Overcoming Systematic Yield Limiters with Diagnosis-Driven Yield Analysis
Diagnosis-driven yield analysis (DDYA) is a technology that uses production test results, volume scan diagnosis, and statistical analysis to find the cause of yield loss in IC chips. It helps with yield ramp of new manufacturing processes, improving yield of mature processes, and meeting test quality standards for automotive ICs. You can build an effective yield analysis flow by combining highly accurate volume scan diagnosis in Tessent Diagnosis with visualization and statistical analysis in Tessent YieldInsight. Applying yield analysis based on volume scan diagnosis results that incorporate design layout and failure data, rather than relying on manufacturing process data alone, can reduce the cycle time to root cause of yield loss by 75-90%.