Multi-layer deep data performance monitoring and optimization
Tessent Embedded Analytics
Combining functional and parametric monitoring of the real-world behavior of complex SoCs provides a powerful new approach that facilitates performance optimization during development and in the field, improves security and safety, and enables predictive maintenance to prevent field failures. proteanTecs’ Universal Chip Telemetry (UCT) and Siemens’ Tessent Embedded Analytics are complementary technologies that enable just such an approach, informed by Deep Data.
