white paper
Measuring ISO 26262 Metrics of Analog Circuitry in ICs
ISO 26262 specifies circuit metrics and minimum values that are design requirements. Since the focus of the standard is minimizing the likelihood of unsafe failures, the likelihood of each fault/defect must be estimated to be able to compute these metrics.
This paper first discusses these metrics and their relationship to each other. Then it discusses how to measure each of the metrics with Tessent DefectSim.