Everything you need to know about work in progress on IEEE 1149.1 and IEEE 1687 revisions, and the new proposed related standards.
The widely used test standards IEEE 1149.1 (JTAG) and IEEE 1687 (IJTAG) were published in 2013 and 2014, respectively. Because actively used IEEE standards should be revised every ten years, both standards are being refreshed. Since 2014, other standards based on 1687 were developed, including IEEE P1687.1, IEEE P1687.2, and P2654.
This paper gives an update on the family of IEEE test standards, including 1149.1, 1687, P2654, and 1838 and is based on a paper presented at the 2023 VLSI Test Symposium.