white paper
Critical area based test pattern optimization for high-quality test
Measure pattern value based on the likelihood of the physical defects occurring
Total critical area (TCA) is the area in a design layout that determines the likelihood that a specific physical defect can cause a failure in the design TCA coverage is a significantly better measure for the quality of the applied test patterns than counting just the number of faults or defects. TCA-weighted ATPG represents a major step forward in ATPG for high-quality test for ICs that require very low defectivity, including automotive ICs that need to meet the ISO 26262 functional safety and quality standard.
Key features of TCA-weighted ATPG include:
• Selecting the most effective patterns
• Choosing targets for pattern types and coverage
• Determining the effectiveness of new pattern types
• Grading pattern value by likelihood to detect defects
• Automatically sorting and selecting patterns
• Creating a smaller pattern set by targeting multiple fault models in our ATPG run