SSN implementation on a large multi-die SoC

Intel's success with Tessent Streaming Scan Network packetized test

Intel’s Devices Development Group described their SSN implementation on a multi-die design, in which different die using different test fabrics share the same IO. Two of the die used Tessent SSN and the other two used a custom test fabric. This approach allows them to phase in SSN over time.

This video shows that the implementation was straightforward, requiring no more effort than their custom fabrics. They report seeing over 2X efficiency gains with pattern retargeting and testing multiple cores in parallel. SSN is able to automatically tune the bandwidth.