Reducing systematic defects using Calibre wafer defect engineering and machine learning solutions

As design rules shrink and process steps increase, yield learning has slowed. Reducing wafer defects, and particularly systematic defects has become more important than ever. Siemens's Calibre technologies can contribute to yield ramp, especially in wafer defect engineering by reducing systematic defects. This video presents an enhanced workflow for wafer defect engineering using machine learning techniques.