No-compromise DFT: Tessent Streaming Scan Network

This video describes the basic components of the Tessent Streaming Scan Network (SSN), which solves many DFT planning and implementation challenges in complex SoCs. By decoupling chip and core level DFT, it enables simultaneous testing of any number of cores with few chip-level pins, and it has multiple features to reduce test time and test data volume. It can test any number of identical core instances in near-constant time, minimizes padding in the presence of cores with mismatched pattern counts and/or scan chain lengths, and enables fast streaming of data to/from and throughout the chip. It simplifies design planning and implementation and is especially well suited for tile-based designs.