This product presentation describes the advantages of using Tessent TestKompress for managing test quality, test time, design flow, and test pattern generation throughput.
Learn about basic and advanced fault models and how the requirements to use these models drive the need for compression. Using TestKompress in various configurations such as low pin count testing (LPCT) and block-based design are discussed.
TestKompress supports all traditional fault models used for uncovering both static and dynamically activated defects. Support for user-defined fault models also allows virtually any defect mechanism to be modeled and targeted.
Built on the patented Embedded Deterministic Test (EDT) technology, Tessent TestKompress reduces both test time and pattern volume by several orders of magnitude without any loss in fault coverage.
TestKompress offers comprehensive automation, TCL-based scripting, and introspection capabilities. To maximize throughput, automatic test pattern generation (ATPG) can be distributed across multiple processors.