presentation
TSMC OIP 2021
Tessent Solutions for robust IC test and yield learning
The challenges faced by the semiconductor industry are caused by technology, design, and system scaling. Tessent test and yield software products offer solutions for time-to-market and quality test.
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Effortless Embedded TAP Controller Insertion Tessent Platform
A tap controller, or Test Access Port (TAP) controller, is a critical component in the design-for-test (DFT) methodology used in…
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Tessent YieldInsight
When a new manufacturing process is introduced, or a new product is introduced on a mature manufacturing process, yields will tend to be significantly lower than acceptable.
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Automotive-grade ATPG
Tessent TestKompress with Automotive-grade ATPG overcomes the quality limitations of traditional DFT methodologies by targeting defects in ICs at the transistor and interconnect levels.