As part of Tessent TestKompress and Tessent FastScan, ATPG Boost reduces pattern count by an average of 23% at the same test coverage, which translates to significant savings in test cost and opens up the opportunity to explore new fault models and further improve test quality. It also is better at detecting remaining undetected faults, reducing remaining faults by an average of 7.6%. In addition to these default ATPG capabilities that are ideal for most designs, ATPG Boost provides options to specifically target hard-to-detect aborted faults. In addition to core ATPG capabilities that improve test coverage and pattern count, ATPG Boost also enables significantly faster run time with distribution when running on multiple hosts.
