Solving complex 3D die stacking challenges
The demand for smaller, higher-performing and more power-efficient integrated circuits (ICs) continues. Next-generation devices often feature complex 2.5D and 3D architectures that connect dies vertically (3D IC) or side-by-side (2.5D). 3D die stacking highlights challenges for IC test with legacy approaches built using conventional two-dimensional processes. Siemens EDA’s Tessent Multi-die software solves complex 3D die stacking challenges with a comprehensive DFT automation solution for highly complex tasks associated with 2.5D and 3D IC designs. Learn more about Tessent Multi-die software in this fact sheet.