fact sheet
Tessent LogicBIST
Silicon Test for Safety-Critical Applications
Tessent LogicBIST is the ideal, high-quality silicon test solution for safety-critical devices such as ICs used in automotive and medical applications.
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Fact Sheet
Tessent Hybrid TK/LBIST
The solution shares on-chip DFT resources such as scan chains and clock control logic.
Fact Sheet
Tessent In-System Test
The Tessent In-System Test software with embedded on-chip in-system test controller enables test and diagnosis of semiconductor chips throughout their silicon lifecycle.
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Tessent ScanPro
Advanced designs require design-for-test. Tessent ScanPro provides advanced scan DFT features that maximize the