fact sheet

Tessent Hybrid TK/LBIST

Test for Safety-Critical Applications

Although ATPG compression and logic BIST have historically been used independently and for different applications, they possess complementary features that turn out to be very beneficial in combination. Tessent Hybrid TK/LBIST takes advantage of many similarities between the two approaches to deliver a highly efficient combined solution.

The solution shares on-chip DFT resources such as scan chains and clock control logic.

Tessent TK/LBIST also combines the on-chip controller logic for both ATPG compression and logic BIST into a single block that is significantly smaller than the two separate implementations.

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