Tessent Diagnosis

Tessent Diagnosis turns failing test cycles into valuable data. Using layout-aware and cell-aware technology, it determines the defect’s most probable failure mechanism, logic location, and physical location. Tessent Diagnosis uses failure data from manufacturing test, Tessent FastScan or TestKompress patterns, and design information. This detailed analysis of devices that fail manufacturing test greatly reduces the failure analysis effort and creates the foundation for diagnosis-driven yield analysis.