A novel reversible scan chain technology that improves chain diagnosis resolution by 4x

A novel reversible scan chain technology that improves chain diagnosis resolution by 4x.

Hosted by ASM International, this joint webinar between Siemens EDA - Tessent Silicon Lifecycle Solutions and Qualcomm spotlights:

• Motivation for using chain diagnosis in yield ramp
• Overview of chain diagnosis, reversible chain
• Reversible chain technology and diagnosis
• Implementation of reversible chains
• Silicon results from test chip