Logic BIST is an important measure for being compliant with Functional Safety standards such as ISO26262. It is widely used as an in-system test in order to detect faults that otherwise could violate safety goals. However, the pseudo-random nature of LBIST poses a challenge to MCU designers: the necessary test time for reaching certain coverage goals often contradicts runtime requirements formulated by customers. This presentation by Daniel Tille of Infineon shows the use of the LogicBIST with Observation Scan Technology, which is proven to drastically reduce LBIST test time for Infineon Automotive MCUs.