Using Veloce to enable test coverage metrics for MBIST on a SoC

Modern SoCs are rich in memory instances, nearly all require memory built-in self-test (MBIST). It is possible to insert MBIST so that MBIST coverage overlaps with functional paths. This raises the possibility to use MBIST to cover some faults that otherwise would have required additional automatic test-pattern generator (ATPG) patterns, potentially reducing test time and unit cost for the System on Chip (SoC).