Baseline Wander: systematic approach to rapid simulation and measurement

High-speed serial data transmissions can suffer loss of margin as well as data errors due to baseline wander caused by mechanisms such as AC coupling. Thorough simulation and measurement are difficult since they involve interaction between physical layer fidelity features from sub-MHz to tens of GHz of signal spectra, and must include effects accumulated over millions of UIs. We show a method of rapid analysis of baseline wander that quickly spans the large frequency range required, and consider its implementation in both bit-by-bit and statistical analysis. We demonstrate this method on extreme cases of signals in PAM4 signalling and show measurement and simulation correlation.

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