As cars become increasingly computerized and their safety functions are evolving rapidly, the number of complex safety-critical components deployed in autonomous vehicles is progressively rising with high-end models containing more than a hundred embedded microcontrollers. These integrated circuits must adhere to stringent requirements for high quality and long-term reliability driven by functional safety standards. Consequently, such requirements demand test solutions that address challenges posed by automotive electronics. This presentation talks briefly about a paper that presents a scan-based LBIST scheme, called Observation Scan, that optimizes test time and area overhead during in-system test applications for automotive ICs. It ensures highly reliable operations of ICs for the duration of their lifespan.