Checking ESD path resistance in IC designs

Finding and eliminating ESD issues is critical to ensuring the reliability of IC chip designs, but it’s also difficult, requiring significant time and resources. The Calibre® PERC™ reliability platform provides a complete, automated checking solution for quickly and accurately detecting and debugging point-to-point resistance violations and bottlenecks in ESD paths, enabling designers to deliver even the largest and most complex IC designs on schedule without compromising performance reliability.